Advanced Mathematical and Computational Tools in Metrology and Testing Xi(Advances in Mathematics for Applied Sciences)

计量和检测中的高级数学与计算工具XI

应用数学

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1715
售   价:
1372.00
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平台大促 低至8折优惠
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2019年01月31日
装      帧
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ISBN
9789813274297
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页      码
460
语      种
英文
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图书简介
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools Metrology conference held at the University of Strathclyde, Glasgow, in September, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and evaluation measurement uncertainty, and describe their applications in a wide range of measurement areas. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences. Key Features: ○Description of state of the art techniques for modeling measurement systems and analyzing measurement data ○Written by researchers active in institutions developing world-leading measurement capabilities ○Provides a multi-disciplinary approach to addressing measurement challenges in a wide range of applications
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