Esd Testing - from Components to Systems

ESD 测试:从元器件到系统

工程热物理

原   价:
1552.5
售   价:
1242.00
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平台大促 低至8折优惠
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2016年10月18日
装      帧
精装
ISBN
9780470511916
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页      码
328
语      种
英文
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图书简介
This book presents information on electrostatic discharge (ESD) and the characterization of semiconductor devices. This is essential in order to prevent potentially serious damage to many electronic applications caused through ESD, and to develop more robust semiconductor devices. Voldman begins the book by examining ESD physical models, and then moving onto discuss the test systems, testing and specifications of each model. These include RF ESD test systems, magnetic recording (MR) systems and latchup. Chapter 3 looks at advanced ESD testing methods, followed by a look at established test structures and design, such as ESD technology benchmarking. The remaining chapters focus on ESD characterization, starting with test structure characterization and the ESD testing of input circuits and power clamps, going on to analyse more advanced technologies such as CMOS and RF CMOS, Bipolar and BiCMOS characterization and finally latchup characterization
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