Yan Sun, University of Rhode Island Department of Electrical &, Kingston, RI, USA; Wade Trappe, Rutgers University Technology Centre of New Jersey, North Brunswick, NJ, USA; K. J. Ray Liu, University / 2007-10-09 / Springer US
Tom McMaster; David Wastell; Elaine Ferneley; Janice I. DeGross, University of Minnesota Carlson School of Management, Minneapolis, MN, USA / 2007-06-01 / Springer US